The optical characterization of organometallic complex thin films by spectroscopic ellipsometry and photovoltaic diode application
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CitationÖzaydın, C., Güllü, Ö, Pakma, O., İlhan, S., Akkılıç, K. (2016). The optical characterization of organometallic complex thin films by spectroscopic ellipsometry and photovoltaic diode application. Materials Research Bulletin, 77, pp. 115-121. https://doi.org/10.1016/j.materresbull.2016.01.021
In this work, organometallic complex (OMC) films have been deposited onto glass or silicon substrates by spin coating technique and their photovoltaic application potential has been investigated. Optical properties and thickness of the film have been investigated by spectroscopic ellipsometry (SE). Also, transmittance spectrum has been taken by UV/vis spectrophotometer. The optical method has been used to determine the band gap value of the films. Also, Au/OMC/n-Si metal/interlayer/semiconductor (MIS) diode has been fabricated. Current-voltage and photovoltaic properties of the structure were investigated. The ideality factor (n) and barrier height (Φb) values of the diode were found to be 2.89 and 0.79 eV, respectively. The device shows photovoltaic behavior with a maximum open-circuit voltage of 396 mV and a short circuit current of 33.8 μA under 300 W light.
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