Temperature dependent electrical transport in Al/Poly(4-vinyl phenol)/ p -GaAs metal-oxide-semiconductor by sol-gel spin coating method
MetadataShow full item record
CitationÖzden, Ş., Tozlu, C., Pakma, O. (2016). Temperature dependent electrical transport in Al/Poly(4-vinyl phenol)/ p -GaAs metal-oxide-semiconductor by sol-gel spin coating method. International Journal of Photoenergy. https://doi.org/10.1155/2016/6157905
Deposition of poly(4-vinyl phenol) insulator layer is carried out by applying the spin coating technique onto p-type GaAs substrate so as to create Al/poly(4-vinyl phenol)/p-GaAs metal-oxide-semiconductor (MOS) structure. Temperature was set to 80-320 K while the current-voltage (I-V) characteristics of the structure were examined in the study. Ideality factor (n) and barrier height (φ b) values found in the experiment ranged from 3.13 and 0.616 eV (320 K) to 11.56 and 0.147 eV (80 K). Comparing the thermionic field emission theory and thermionic emission theory, the temperature dependent ideality factor behavior displayed that thermionic field emission theory is more valid than the latter. The calculated tunneling energy was 96 meV.
SourceInternational Journal of Photoenergy
The following license files are associated with this item: