Güllü, ÖmerTurut, AbdulmecitAsubay, Sezai2021-04-152021-04-152008-03-25Güllü, Ö., Turut, A., Asubay, S. (2008). Determination of the laterally homogeneous barrier height of thermally annealed and unannealed Au/p-InP/Zn-Au Schottky barrier diodes. Applied Surface Science, 254(11), pp.3558-3561. https://dx.doi.org/10.1016/j.apsusc.2007.11.050https://dx.doi.org/10.1016/j.apsusc.2007.11.050https://hdl.handle.net/20.500.12402/2893We have identically prepared Au/p-InP Schottky barrier diodes (SBDs). The diodes were annealed up to 400 °C thermally. The barrier height (BH) for the as-deposited Au/p-InP/Zn-Au SBDs from the current–voltage characteristics have varied from 0.58 to 0.72 eV, and ideality factor n from 1.14 to 1.47. The BH for the annealed SBDs from the current–voltage characteristics have varied from 0.76 to 0.82 eV, and ideality factor n from 1.17 to 1.39. As a result of the thermal annealing, it has been seen that the BH values of the annealed SBDs are larger than those of the as-deposited SBDs. We have determined a lateral homogeneous BH value of 0.72 eV for the as-deposited Au/p-InP SBD from the experimental linear relationship between barrier heights and ideality factors, and a value of 0.85 eV for the annealed Au/p-InP SBD. The increase of 0.13 eV in the BH value by means of 400 °C annealing has been ascribed to the formation of the excess charges that electrically actives on the semiconductor surface.eninfo:eu-repo/semantics/restrictedAccessInP SemiconductorSchottky Barrier HeightMetal–Semiconductor-MetalcontactsBarrier İnhomogeneityArticle2541135583561N/AN/A