The optical characterization of organometallic complex thin films by spectroscopic ellipsometry and photovoltaic diode application

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dc.authorid0000-0001-6690-0122en_US
dc.authorid0000-0002-3785-6190en_US
dc.authorid0000-0002-3098-0973en_US
dc.authorid0000-0003-0779-2744en_US
dc.contributor.authorÖzaydın, Cihat
dc.contributor.authorGüllü, Ömer
dc.contributor.authorPakma, Osman
dc.contributor.authorİlhan, Salih
dc.contributor.authorAkkılıç, Kemal
dc.date.accessioned2019-07-05T09:47:36Z
dc.date.available2019-07-05T09:47:36Z
dc.date.issued2016-05en_US
dc.departmentBatman Üniversitesi Fen - Edebiyat Fakültesi Fizik Bölümüen_US
dc.departmentBatman Üniversitesi Mühendislik - Mimarlık Fakültesi Bilgisayar Mühendisliği Bölümü
dc.description.abstractIn this work, organometallic complex (OMC) films have been deposited onto glass or silicon substrates by spin coating technique and their photovoltaic application potential has been investigated. Optical properties and thickness of the film have been investigated by spectroscopic ellipsometry (SE). Also, transmittance spectrum has been taken by UV/vis spectrophotometer. The optical method has been used to determine the band gap value of the films. Also, Au/OMC/n-Si metal/interlayer/semiconductor (MIS) diode has been fabricated. Current-voltage and photovoltaic properties of the structure were investigated. The ideality factor (n) and barrier height (Φb) values of the diode were found to be 2.89 and 0.79 eV, respectively. The device shows photovoltaic behavior with a maximum open-circuit voltage of 396 mV and a short circuit current of 33.8 μA under 300 W light.en_US
dc.description.sponsorshipThis study is supported by Republic of Turkey—Prime Ministry State Planning organization (DPT) (Project Number: 2010K120610, Batman University Central Research Laboratory).en_US
dc.identifier.citationÖzaydın, C., Güllü, Ö, Pakma, O., İlhan, S., Akkılıç, K. (2016). The optical characterization of organometallic complex thin films by spectroscopic ellipsometry and photovoltaic diode application. Materials Research Bulletin, 77, pp. 115-121. https://doi.org/10.1016/j.materresbull.2016.01.021en_US
dc.identifier.endpage121en_US
dc.identifier.issn0025-5408
dc.identifier.scopusqualityQ1en_US
dc.identifier.startpage115en_US
dc.identifier.urihttps://doi.org/10.1016/j.materresbull.2016.01.021
dc.identifier.urihttps://hdl.handle.net/20.500.12402/2210
dc.identifier.volume77en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.relation.isversionof10.1016/j.materresbull.2016.01.021en_US
dc.relation.journalMaterials Research Bulletinen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.rightsAttribution-NonCommercial-ShareAlike 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/us/*
dc.subjectElectronic Materialsen_US
dc.subjectOrganic Compoundsen_US
dc.subjectSol–Gel Chemistryen_US
dc.subjectElectron Microscopyen_US
dc.subjectElectrical Propertiesen_US
dc.subjectElectronic Structureen_US
dc.titleThe optical characterization of organometallic complex thin films by spectroscopic ellipsometry and photovoltaic diode applicationen_US
dc.typeArticleen_US

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