N-type InP Schottky diodes with organic thin layer: Electrical and interfacial properties
dc.authorid | 0000-0002-3785-6190 | en_US |
dc.contributor.author | Güllü, Ömer | |
dc.contributor.author | Turut, Abdulmecit | |
dc.date.accessioned | 2021-04-14T10:42:20Z | |
dc.date.available | 2021-04-14T10:42:20Z | |
dc.date.issued | 2010-03 | en_US |
dc.department | Batman Üniversitesi Fen - Edebiyat Fakültesi Fizik Bölümü | en_US |
dc.description.abstract | The rectifying junction characteristics of methyl red (MR) organic film on n-type InP substrate have been studied. It has been observed that MR-based structure shows an excellent rectifying behavior and that the MR film increases the effective barrier height by influencing the space charge region of the n-type InP. The barrier height and ideality factor values for this structure have been obtained as 0.75 eV and 1.93 from the forward bias current-voltage characteristics, respectively. By using capacitance-voltage characteristics at 1 MHz, the barrier height and the carrier concentration values have been calculated as 0.93 eV and 5.13×1015 cm−3, respectively. The energy distributions of the interface states and their relaxation times have been determined from the forward bias capacitance-frequency and conductance-frequency characteristics. Moreover, it was seen that both the interface-state density and the relaxation time of the interface states decreased with bias voltage from experimental results. | en_US |
dc.identifier.citation | Güllü, Ö., Turut, A. (2010). N-type InP Schottky diodes with organic thin layer: Electrical and interfacial properties. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 28(3). pp.466. https://dx.doi.org/10.1116/1.3377141 | en_US |
dc.identifier.issn | 10711023 | |
dc.identifier.issue | 3 | en_US |
dc.identifier.scopusquality | N/A | en_US |
dc.identifier.startpage | 466 | en_US |
dc.identifier.uri | https://dx.doi.org/10.1116/1.3377141 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12402/2880 | |
dc.identifier.volume | 28 | en_US |
dc.identifier.wosquality | N/A | en_US |
dc.indekslendigikaynak | Web of Science | en_US |
dc.indekslendigikaynak | Scopus | en_US |
dc.language.iso | en | en_US |
dc.publisher | Journal of Vacuum Science & Technology B | en_US |
dc.relation.isversionof | 10.1116/1.3377141 | en_US |
dc.relation.journal | Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/restrictedAccess | en_US |
dc.rights | Attribution-NonCommercial-ShareAlike 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/3.0/us/ | * |
dc.title | N-type InP Schottky diodes with organic thin layer: Electrical and interfacial properties | en_US |
dc.type | Article | en_US |