Synthesis and characterization of vanadium oxide thin films on different substrates
Yükleniyor...
Tarih
2017-04-11
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Springer Nature
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Attribution-NonCommercial-ShareAlike 3.0 United States
Attribution-NonCommercial-ShareAlike 3.0 United States
Özet
In this study, the V8O15 derivative of vanadium oxide was produced on plain glass, indium tin oxide and silicon wafer substrate layers by taking advantage of wet chemical synthesis which is an easy and economical method. The structural properties of the produced films were examined by XRD and SEM analyses. Besides, Al/VOx/p-Si metal-oxide-semiconductor (MOS) structure was obtained by the same synthesis method. Doping densities of these MOS structures were calculated from frequency dependent capacitance–voltage measurements. It was determined that the interface states which were assigned with the help of these parameters vary according to frequency.
Açıklama
Anahtar Kelimeler
Interface State, Vanadium Oxide, Amorphous Glass, Triclinic Structure, Plain Glass
Kaynak
WoS Q Değeri
Q2
Scopus Q Değeri
Q2
Cilt
28
Sayı
15
Künye
Pakma, O., Özaydın, C., Özden, Ş, Kariper, I. A., Güllü, Ö. (2017). Synthesis and characterization of vanadium oxide thin films on different substrates. Journal of Materials Science: Materials in Electronics, 28(15), pp. 10909-10913. https://doi.org/10.1007/s10854-017-6870-1
