Synthesis and characterization of vanadium oxide thin films on different substrates

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dc.authorid0000-0002-3785-6190en_US
dc.authorid0000-0003-3147-0526en_US
dc.authorid0000-0001-6690-0122en_US
dc.authorid0000-0003-0716-9194en_US
dc.authorid0000-0001-9127-301Xen_US
dc.contributor.authorGüllü, Ömer
dc.contributor.authorPakma, Osman
dc.contributor.authorÖzaydın, Cihat
dc.contributor.authorÖzden, Şadan
dc.contributor.authorKariper, İshak Afşin
dc.date.accessioned2019-07-05T08:56:30Z
dc.date.available2019-07-05T08:56:30Z
dc.date.issued2017-04-11en_US
dc.departmentBatman Üniversitesi Fen - Edebiyat Fakültesi Fizik Bölümüen_US
dc.departmentBatman Üniversitesi Mühendislik - Mimarlık Fakültesi Bilgisayar Mühendisliği Bölümüen_US
dc.description.abstractIn this study, the V8O15 derivative of vanadium oxide was produced on plain glass, indium tin oxide and silicon wafer substrate layers by taking advantage of wet chemical synthesis which is an easy and economical method. The structural properties of the produced films were examined by XRD and SEM analyses. Besides, Al/VOx/p-Si metal-oxide-semiconductor (MOS) structure was obtained by the same synthesis method. Doping densities of these MOS structures were calculated from frequency dependent capacitance–voltage measurements. It was determined that the interface states which were assigned with the help of these parameters vary according to frequency.en_US
dc.identifier.citationPakma, O., Özaydın, C., Özden, Ş, Kariper, I. A., Güllü, Ö. (2017). Synthesis and characterization of vanadium oxide thin films on different substrates. Journal of Materials Science: Materials in Electronics, 28(15), pp. 10909-10913. https://doi.org/10.1007/s10854-017-6870-1en_US
dc.identifier.endpage10913en_US
dc.identifier.issn0957-4522
dc.identifier.issn1573-482X
dc.identifier.issue15en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.startpage10909en_US
dc.identifier.urihttps://doi.org/10.1007/s10854-017-6870-1
dc.identifier.urihttps://hdl.handle.net/20.500.12402/2206
dc.identifier.volume28en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherSpringer Natureen_US
dc.relation.journalJournal of Materials Science: Materials in Electronicsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.rightsAttribution-NonCommercial-ShareAlike 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/us/*
dc.subjectInterface Stateen_US
dc.subjectVanadium Oxideen_US
dc.subjectAmorphous Glassen_US
dc.subjectTriclinic Structureen_US
dc.subjectPlain Glassen_US
dc.titleSynthesis and characterization of vanadium oxide thin films on different substratesen_US
dc.typeArticleen_US

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